Akademik Veri Yönetim Sistemi
Journal of Electrocardiology, cilt.67, ss.158-165, 2021 (SCI-Expanded)
Background: Atrial arrhythmias are well-known complications of atrial septal defect (ASD), and associated with substantial morbidity. After ASD closure, right atrial and ventricular enlargement regresses, however, the risk of atrial arrhythmia development continues. In this study, we aimed to investigate the relationship between the Crochetage sign, which is a possible reflection of heterogeneous ventricular depolarization due to long-term hemodynamic overload, and the development of late atrial arrhythmia after ASD closure. Methods: This retrospective study included a total of 314 patients (mean age: 39.5 (30–50) years; male: 115) who underwent percutaneous device closure for secundum ASD. The study population was divided into two groups according to the presence or absence of the Crochetage sign. The Crochetage sign was defined as an M-shaped or bifid pattern notch on the R wave in one or more inferior limb leads. Cox-regression analysis was performed to determine independent predictors of late atrial arrhythmia development. Result: Fifty-seven patients (18.1%) presented with late atrial arrhythmia. Of these 57 patients, 30 developed new-onset atrial fibrillation/atrial flutter (AF/AFL), and 27 patients with pre-procedure paroxysmal AF/AFL had a recurrence of AF/AFL during follow-up. History of paroxysmal AF/AFL before the procedure (HR: 4.78; 95% CI 2,52–9.05; p < 0.001), the presence of Crochetage sign (HR: 3.90; 95% CI 2.05–7.76; p < 0.001), and older age at the time of ASD closure (HR: 1.03; 95% CI 1.01–1.06; p = 0.002) were found as independent predictors for late atrial arrhythmia. Conclusion: The presence of Crochetage sign may be used to predict the risk of late atrial arrhythmia development after transcatheter ASD closure.