Quasi-static impact resistance and damage mechanisms of polymer hybrid nanocomposites


ERKENDİRCİ Ö. F., Avcı A.

Plastics, Rubber and Composites, vol.49, no.1, pp.25-34, 2020 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 49 Issue: 1
  • Publication Date: 2020
  • Doi Number: 10.1080/14658011.2019.1678940
  • Journal Name: Plastics, Rubber and Composites
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Page Numbers: pp.25-34
  • Keywords: damage mechanism, Hybrid composites, impact, nanomaterials, quasi static
  • Uşak University Affiliated: No

Abstract

Quasi-static (QS) punch shear damage of a composite material is an important damage mode during the penetration and perforation of fibre-reinforced composites and also QS punch shear penetration resistance of a composite material shows the energy dissipating capacity of material under transverse loading without dynamic and rate effects. In this paper, a study of QS penetration resistance behaviour of the single-walled carbon nanotubes (CNT) are added into epoxy resin L160 reinforced with plain weave PW Carbon/Glass hybrid nanocomposite materials with varying thicknesses, i.e. 1.18–6.75 mm which are laminated 3 layers (3L), 5L, 7L, 11L, 15L and 21L The penetration resistance is usually shown by a load–displacement graph, integral of which is the energy dissipated by the composite during penetration. Most important objective of this study is to find out relationship of the impact penetration resistance of any layer by using the data obtained from penetration forces, dissipated energies and other values in the different layers with together graphs and functions. Therefore, the effect of CNT and similar properties has not been compared with other hybrid nanocomposites and studies. The damage mechanism of the composite material is explained in detail with stereomicroscope, photograph and SEM images.