Performance analysis of RIS-empowered OFDM-IM communications under Weibull fading and joint Tx/Rx I/Q imbalance

Ceniklioğlu B., Develi I., Canbilen A. E.

TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES, vol.33, no.6, pp.803-815, 2025 (SCI-Expanded, Scopus, TRDizin)

• Publication Type: Article / Article
• Volume: 33 Issue: 6
• Publication Date: 2025
• Doi Number: 10.55730/1300-0632.4158
• Journal Name: TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES
• Journal Indexes: Scopus, Science Citation Index Expanded (SCI-EXPANDED), Compendex, TR DİZİN (ULAKBİM)
• Page Numbers: pp.803-815
• Uşak University Affiliated: Yes